UHR Dual Beam FIB System: Helios NanoLAB 600i (FEI)
Powerful electron and ion beam tool for imaging, patterning and precise TEM sample preparation
Advanced DualBeam for ultra-high resolution imaging, analysis and fabrication at the nanoscale. This FEI tool offers advances in the ion beam, electron beam, patterning and a range of features to make milling, imaging, analysis and sample preparation down to a nanoscale, standard applications in the lab.
SEM with EDS
Ultra high resolution scanning electron imaging coupled with material spectroscopy tools
The ULTRA 55 represents the latest development in GEMINI technology. Based on the SUPRA 55, the ULTRA 55 now comprises a fully integrated Energy and angle selective Backscattered electron (EsB) detector. The ULTRA 55 offers ultra high resolution for both SE to image surface information and BSE to present compositional information. The new EsB detector features an integrated filtering grid to enhance image quality and requires no additional adjustments. The EsB detector is less sensitive for edge contrast and charging effects which enables precise imaging and measurement of boundaries, particles, and features. Combined with the large multi-port analytical chamber, the fully motorised 5-axes motorised eucentric stage and the GEMINI high current mode the ULTRA 55 also offers superb analytical capabilities.
SEM with MonoCL
Ultra high resolution scanning electron with monochromatic imaging spectroscopy tools
Multi-technique X-ray Photoelectron Spectroscopy with XPS-mapping capability
XPS tool for materials identification and analysis, and advanced studies
AXIS ULTRA, a natural evolution from the AXIS 165, integrates the Kratos patented Magnetic Immersion Lens and Charge Neutralisation System with our new, patented Spherical Mirror Analyser. The Spherical Mirror Analyser provides real time chemical state and elemental imaging using the full range of pass energies and multi-point analysis from either real time or scanned images without the need for sample translation. A microchannel plate and phosphor detection system are incorporated into the system to provide a parallel imaging capability with high spatial resolution and high sensitivity. Advanced zoom optics enable a variable viewing area for the identification of macro or micro features. The instrument's exceptional small spot capabilities (< 15 microns) are achieved via a combination of the magnetic lens and selected area apertures. The AXIS line of multi-technique photoelectron spectrometers provides scientists with unsurpassed performance for applications which require high energy resolution and high spatial resolution, high sensitivity, time efficiency and ease of use.
Transmission Electron Microscope (Titan Themis 300kV from FEI, now Thermo)
Measurement capabilities include the following:-
- Ultra-bright XFEG gun
- 60-300kV, suitable for beam-sensitive samples
- 4K x 4K CMOS camera
- Single tilt and double tilt specimen holders
- New computerized 5-axis specimen piezo-stage
- Super-X quad EDS detector for super-fast elemental analysis
- EDX Solid State Detector
- HRTEM and STEM mode
- HAADF (High Angle Annular Dark Field Imaging) and triple Dark Field/Bright Field (DF/BF) detectors for simultaneous imaging in STEM mode
- SAED (Selected Area Electron Diffraction)